Kandpal, M., Dass, M., Singh, J. and Behera, S. N. (2020) “Experimental analysis of conformality of E–beam deposited thin films for MEMS applications”, Manufacturing Technology Today , 19(9), pp. 51–55. Available at: https://mtt.cmti.res.in/index.php/journal/article/view/128 (Accessed: 21 November 2024).