JAN, H.; KULKARNI, P.; JASWAL, A.; HARSHA, S. Advancements in x-ray microscopy for the non-destructive metallurgical characterization of mesoscale components . Manufacturing Technology Today , [S. l.], v. 24, n. 9-10, p. 18–26, 2025. DOI: 10.58368/MTT.24.9-10.2025.18-26. Disponível em: https://mtt.cmti.res.in/index.php/journal/article/view/344. Acesso em: 28 sep. 2026.