VERMA, B.; INCHARA, S. M.; SANFIYA BANU, M. H.; DEEPA, R.; KAVITHA, V. Deep learning-based defect detection in pulsed thermography. Manufacturing Technology Today , [S. l.], v. 23, n. 9-10, p. 1–9, 2024. DOI: 10.58368/MTT.23.9-10.2024.1-9. Disponível em: https://mtt.cmti.res.in/index.php/journal/article/view/320. Acesso em: 28 sep. 2026.