SINGH, S.; NIKETH, S.; SAMUEL, G. L. Effect of repetition rate and peak fluence on ablation depth with ultrashort pulse laser irradiation in silicon. Manufacturing Technology Today , [S. l.], v. 22, n. 6, p. 54–60, 2023. DOI: 10.58368/MTT.22.6.2023.54-60. Disponível em: https://mtt.cmti.res.in/index.php/journal/article/view/259. Acesso em: 24 nov. 2024.